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E. I. Vatajelu, J. Figueras, “Efficiency Evaluation of Parametric Failure Mitigation Techiques for Reliable SRAM Operation”, Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012, pp. 1343-1348. DOI: 10.1109/DATE.2012.6176700
Located in Publications
D. Rodopoulos, A. Papanikolaou and F. Catthoor, "Software Mitigation of Transient Errors on the Single-Chip Cloud Computer", in IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE), Urbana-Champaign, IL, US, 2012.
Located in Publications
E. Amat et al., “Impact bulk/SOI 10nm FinFETs on 3T1D-DRAM cell performance” 11th IEEE Int. Conf. on Solid-State and Integrated Circuits Technology (ICSICT), 2012, Xi’an, China.
Located in Publications
S. Ganapathy, R. Canal, D. Alexandrescu, E. Costenaro, A. Gonzalez, A. Rubio, “A novel variation-tolerant 4T-DRAM with enhanced soft-error tolerance”, ICCD 2012, pp. 472-477. DOI: 10.1109/ICCD.2012.6378681
Located in Publications
G. Upasani, X. Vera, A. Gonzalez, “Setting and error detection infrastructure with low cost acoustic wave detectors”, International Symposium on Computer Architecture (ISCA 2012), pp. 333-343. DOI: 10.1145/2366231.2337198
Located in Publications
E. Amat, et al., “Analysis of FinFET technology on memories", IEEE Int. On-line Test Symposium, p. 169, 2012, p. 169. DOI: 10.1109/IOLTS.2012.6313866
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N. Aymerich, R.Canal, A.Gonzalez, A. Rubio, “Fault-tolerant nanoscale architecture based on linear threshold gates with redundancy” Microprocessors and Microprosystems, volumen 36, issue 5, July 2012, pp. 420-426, DOI 10.1016/j.micpro.2012.02.003
Located in Publications
M. Neagu, L. Miclea, “Modified Berger codes for on-line DRAM repair strategies”, IEEE AQTR, 2012, pp. 296-301. May 2012. DOI: 10.1109/AQTR.2012.6237720
Located in Publications
N. Aymerich, S. Corin and A. Rubio, “Adaptive fault-tolerant architecture for unreliable technologies with heterogeneous variability”, IEEE Transaction on Nanotechnology, volumen 11, issue 4, pp. 818-829, May 2012, DOI 10.1109/TNANO.2012.2199513
Located in Publications
B. Cheng, A.R. Brown, X. Wang, A. ASenov, “Statistical variability stydy of extreme-scaled SOI Fin-FET devices”, Silicon Nanoelectronics Workshop, Honolulu, June 10-11, pp. 69-70, 2012. DOI: 10.1109/SNW.2012.6243343
Located in Publications