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N. Nivard, R. Canal, A. Gonzalez, A. Rubio, “Impact of positive temperature instability on 3T1D DRAM cells integration”, VLSI Journal Integration, 45-3, pp. 246-252, 2012. DOI: 10.1016/j.vlsi.2011.11.014
Located in Publications
X. Wang, A. R. Brown, B. Cheng and A. Asenov, “Statistical Variability and Reliability in Nanoscale FinFETs”, International Electron Devices Meeting (IEDM), Washington D.C., December 2011, pp. 5.4.1-5.4.4. DOI: 10.1109/IEDM.2011.6131494
Located in Publications
I. Vatajelu, J, Figueras, “Transient noise failures SRAM cells dynamic metric”, IEEE Asian Test Symposium, New Delhi, 2011, pp. 413-418. DOI: 10.1109/ATS.2011.64
Located in Publications
S. Ganapathy, R. Canal, A. González, A. Rubio. “Dynamic Fine-Grain Body Biasing of Caches with Latency and Leakage 3T1D-Based Monitors”. 29th IEEE International Conference on Computer Design (ICCD'11), Amherst (MA, USA), October 2011, pp. 332-338. DOI: 10.1109/ICCD.2011.6081420
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"Challenges in Computing in the Age of Heterogeneous Computing" 29th IEEE International Conference on Computer Design (ICCD'11), Amherst (MA, USA), October 2011
Located in Publications
X. Wang, A. R. Brown, N. M. Idris, S. Markov, G. Roy, and A. Asenov, "Statistical threshold-voltage variability in scaled decananometer bulk HKMG MOSFETs: A full-scale 3-D simulation scaling study". IEEE Transactions on Electron Devices, Vol. 58, No. 8, pp. 2293–2301, 2011. DOI: 10.1109/TED.2011.2149531
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C. García and A. Rubio, “A comparative variability analysis for CMOS and CNTFET 6T SRAM cells”, IEEE Int. Midwest Symp. on Circuits and Systems (MWSCAS), pp.1-4, Seoul August 2011. DOI: 10.1109/MWSCAS.2011.6026572
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C. García and A. Rubio, “Carbon nanotube growth process-related variability in CNFETs”, IEEE NANO 2011, August 15-19, pp- 1084-1087, Portland, Oregon. DOI: 10.1109/NANO.2011.6144375
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N. Aymerich, S. Cotofana, A. Rubio, “Adaptive Fault-Tolerant Architecture for Unreliable Device Technologies”, IEEE NANO 2011, August 15-19, pp. 1441-1444, Portland, Oregon. DOI: 10.1109/NANO.2011.6144528
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A.Rubio, A. Asenov. “TRAMS: Variability as a limiting factor of energy efficiency”, Workshop on Energy Efficient Systems, Barcelona, July 18th, 2011.
Located in Publications