Skip to content

Search results

403 items matching your search terms. . Sort by relevance · date (newest first) · alphabetically
Filter the results.
"TCAD simulation of statistical variability"
A. R. Brown, "TCAD simulation of statistical variability" at Workshop on Simulation and Characterization of Statistical CMOS Variability and Reliability, Bologna (September 2010). DOI: No identifier
Located in Publications
P. Zuber, M. Miranda, et al. "Variability and technology aware SRAM Product yield maximization". Intl. Symp. on VLSI Technology, Kyoto, Japan, June 2011, pp. 222-223. ISBN 978-1-4244-9949-6 (IEEE Xplore)
Located in Publications
C. García and A. Rubio, “A comparative variability analysis for CMOS and CNTFET 6T SRAM cells”, IEEE Int. Midwest Symp. on Circuits and Systems (MWSCAS), pp.1-4, Seoul August 2011. DOI: 10.1109/MWSCAS.2011.6026572
Located in Publications
D. Andrade, A. Calomarde, S.D. Cotofana and A. Rubio. “A comprehensive compensation technique for process variations and environmental fluctuations in digital integrated circuits.”, IEEE Proceedings on Midwest Symposium of Circuit and Systems, pp. 630-634, August 2010. DOI: 10.1109/MWSCAS.2010.5548578
Located in Publications
“A holistic approach for statistical analysis of SRAM”
Zuber, P.; Dobrovolny, P. and Miranda Corbalan, M., “A holistic approach for statistical analysis of SRAM”. Proceedings of the 47th ACM/IEEE Design Automation Conference ‐ DAC. 13‐18 July 2010; Anaheim, CA, USA, pp.717-724. ISBN: 978-1-4244-6677-1 (IEEE Xplore)
Located in Publications
“A new probabilistic design methodology of nanoscale digital circuits”. 21st Int. Conference on Communications and Computers (CONIELECOMP), March 2011, pp. 190-193.
Located in Publications
S. Ganapathy, R. Canal, D. Alexandrescu, E. Costenaro, A. Gonzalez, A. Rubio, “A novel variation-tolerant 4T-DRAM with enhanced soft-error tolerance”, ICCD 2012, pp. 472-477. DOI: 10.1109/ICCD.2012.6378681
Located in Publications
N. Aymerich, S. Corin and A. Rubio, “Adaptive fault-tolerant architecture for unreliable technologies with heterogeneous variability”, IEEE Transaction on Nanotechnology, volumen 11, issue 4, pp. 818-829, May 2012, DOI 10.1109/TNANO.2012.2199513
Located in Publications
N. Aymerich, S. Cotofana, A. Rubio, “Adaptive Fault-Tolerant Architecture for Unreliable Device Technologies”, IEEE NANO 2011, August 15-19, pp. 1441-1444, Portland, Oregon. DOI: 10.1109/NANO.2011.6144528
Located in Publications
E. Amat, et al., “Analysis of FinFET technology on memories", IEEE Int. On-line Test Symposium, p. 169, 2012, p. 169. DOI: 10.1109/IOLTS.2012.6313866
Located in Publications