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D. Andrade, A. Rubio, et al.“Analysis of the mismatch of digital circuits by common environment fluctuations”, Proc. IEEE Int. Symp. Circuits and Systems, ISCAS, 15-18th May, Rio de Janeiro, 2011, pp. 2585-2588. DOI: 10.1109/ISCAS.2011.5938133
Located in Publications
J. Carretero, E. Herrero, M. Monchiero, T. Ramirez, X. Vera, “Capturing vulnerability variations for register files”, DATE 2013 (accepted)
Located in Publications
C. García and A. Rubio, “Carbon nanotube growth process-related variability in CNFETs”, IEEE NANO 2011, August 15-19, pp- 1084-1087, Portland, Oregon. DOI: 10.1109/NANO.2011.6144375
Located in Publications
V. Lorente et al., “Combining RAM technologies for hard-error recovery in L1 data caches working at very low power modes”, DATE 2013 (accepted)
Located in Publications
Z. Jaksic, R. Canal, “Comparison of SRAM cells for 10nm SOI FinFETs under process and environmental variations”, IEEE Transactions on Electron Devices, vol.6, no.1, pp. 49-55, January 2013. DOI: 10.1109/TED.2012.2226095
Located in Publications
N. Aymerich, S. Cotofana, A. Rubio, “Controlled degradation stochastic resonance in adaptive averaging cell based architectures”, IEEE Transactions on Nanotechnology (invited, accepted), 2013.
Located in Publications
N. Aymerich, S. Cotofana, A. Rubio, “Degradation Stochastic Resonance (DSR) in AD-AVG architectures”, IEEE Nano 2012, Birmingham, 2012, pp. 1-4. DOI: 10.1109/NANO.2012.6321971
Located in Publications
P. Pouyan, E. Amat, A. Rubio, “Design and implementation of an adaptive proactive reconfiguration technique in SRAM caches”, DATE 2013 (accepted)
Located in Publications
“Design of Boolean functions and memory units based on Resistive Switching devices”
García, C., Moll, F., Rubio., “Design of Boolean functions and memory units based on Resistive Switching devices”, Proc. Design of Electronic Circuits and Systems, October 2010.
Located in Publications
Miguel Miranda. “DEVICE TO PRODUCT LEVEL ASSESSMENT OF PROCESS VARIABILITY”, Invited - 2nd European Workshop on Variability, Grenoble, May 2011
Located in Publications