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“Robustness analysis of 6T SRAM in memory retention mode under PVT variations”
Vatajelu, E.I. and Figueras, J., “Robustness analysis of 6T SRAM in memory retention mode under PVT variations”, accepted for the Design Automation and Test in Europe Conference (DATE) 2011
Located in Publications / retirados
G. Upasani, X. Vera, A. Gonzalez, “Setting and error detection infrastructure with low cost acoustic wave detectors”, International Symposium on Computer Architecture (ISCA 2012), pp. 333-343. DOI: 10.1145/2366231.2337198
Located in Publications
“Simulation of statistical variability in 18 and 13nm bulk MOSFETs”
A. R. Brown, “Simulation of statistical variability in 18 and 13nm bulk MOSFETs”. et al. Intel European Research and Innovation Conference, Leixlip, Ireland, October 2010
Located in Publications
P. Peyman et al., “SRAM lifetime improvement by using adaptive proactive reconfiguration”, MIXDES 2012, 24th-26th May, Warsaw, pp. 115-119. ISBN 978-1-4577-2092-5 (IEEE Xplore)
Located in Publications
Vatajelu, E., Figueras, J., “Statistical Analysis of 6T SRAM Data Retention Voltage under Process Variation”, 14th IEEE Design and Diagnostics of Electronic Circuits and Systems, pp. 365-370, 13-15 April 2011, Cottbus, Germany. DOI: 10.1109/DDECS.2011.5783112
Located in Publications
A. Asenov, A. R. Brown and B. Cheng, “Statistical aspects of NBTI/PBTI and impact on SRAM yield”, IEEE Design, Automation and Test in Europe (DATE), Grenoble, France, March 2011. DOI: 10.1109/DATE.2011.5763240
Located in Publications
Zuber, P.; Miranda Corbalan, M.; Dobrovolny, P.; van der Zanden, K. and Jung, J., “Statistical SRAM analysis for yield enhancement”. Design, Automation and Test in Europe Conference ‐ DATE. 8‐12 March 2010; Dresden, Germany 2010, pp.57-62. ISBN: 978-3-9810801-6-2
Located in Publications
X. Wang, A. R. Brown, B. Cheng and A. Asenov, “Statistical Variability and Reliability in Nanoscale FinFETs”, International Electron Devices Meeting (IEDM), Washington D.C., December 2011, pp. 5.4.1-5.4.4. DOI: 10.1109/IEDM.2011.6131494
Located in Publications
B. Cheng, A.R. Brown, X. Wang, A. ASenov, “Statistical variability stydy of extreme-scaled SOI Fin-FET devices”, Silicon Nanoelectronics Workshop, Honolulu, June 10-11, pp. 69-70, 2012. DOI: 10.1109/SNW.2012.6243343
Located in Publications
E. Amat, et al., “Strain relevance on the improvement of the 3T1D cell performance” MIXDES 2012, 24th-26th May, Warsaw. pp. 120-123. ISBN 978-1-4577-2092-5 (IEEE Xplore)
Located in Publications